Introduction & Context

The Overall Crystal Growth Rate calculation is a fundamental process engineering tool used to predict the rate at which a solid phase grows from a supersaturated liquid solution. In industrial crystallization, this model is critical for designing crystallizers, determining continuous crystallizer residence time requirements, and controlling crystal size distribution (CSD). By employing a combined resistance model, engineers can account for both the transport of solute molecules through the liquid boundary layer (diffusion) and the subsequent incorporation of those molecules into the crystal lattice (surface integration). This calculation is typically applied in the pharmaceutical, food, and specialty chemical industries to ensure product quality and process efficiency.

Methodology & Formulas

The growth process is modeled as a series of resistances, with the total driving force defined as the difference between the bulk concentration and the saturation concentration. The presence of impurities alters these resistances, a phenomenon described in detail in the impurity effect on growth rate, which can significantly impact the overall crystal growth rate.

\[ \Delta C = C - C_{\text{sat}} \]

The mass transfer coefficient kd is determined using the Ranz‑Marshall correlation, which accounts for the hydrodynamic conditions surrounding the crystal and is a key component of the diffusion‑controlled crystal growth rate calculation.

\[ Re = \frac{d_{p} \cdot v}{\nu} \] \[ Sc = \frac{\nu}{D_{AB}} \] \[ Sh = 2 + 0.6 \cdot Re^{1/2} \cdot Sc^{1/3} \] \[ k_{d} = \frac{Sh \cdot D_{AB}}{d_{p}} \]

The overall growth rate constant K combines the mass transfer coefficient kd and the surface integration rate constant kr, as detailed in the surface integration controlled crystal growth rate calculation.

\[ \frac{1}{K} = \frac{1}{k_{d}} + \frac{1}{k_{r}} \qquad\Longrightarrow\qquad K = \frac{k_{d} \cdot k_{r}}{k_{d} + k_{r}} \]

The mass flux RG and the resulting linear growth rate G are calculated as follows:

\[ R_{G} = K \cdot \Delta C \] \[ G = \frac{R_{G}}{\rho_{c}} \]
Regime Condition Physical Significance
Diffusion Controlled \( k_{d} \ll k_{r} \) Mass transfer through the boundary layer is the bottleneck.
Surface Integration Controlled \( k_{r} \ll k_{d} \) Lattice incorporation kinetics limit the growth rate.
Ranz-Marshall Validity \( 0.1 < Re < 1000 \) Empirical range for the Sherwood correlation.